from the RFID Academic Convocations

commonkissingcanRéseaux et Communications

16 févr. 2014 (il y a 3 années et 6 mois)

136 vue(s)

Auto
-
ID Research
-

A Global Perspective

from the RFID Academic Convocations


AUTO
-
ID Labs
-

Stephen Miles, Research Affiliate

Laboratory for Manufacturing Productivity

Massachusetts Institute of Technology


http://autoid.mit.edu


Excerpts from:

“RFID Technology and Applications”

Stephen Miles, Sanjay Sarma, John Williams

Co
-
Editors; Cambridge University Press, 2008


Page
2
,
s_miles@mit.edu


“Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College

Research in Radio Frequency Identification

Hosted by

MIT Auto
-
ID Labs

Laboratory for Manufacturing and
Productivity


Co
-
Chairs:


Steve Miles

Bill Hardgrave, U Arkansas

Duncan MacFarlane
-

Auto
-
ID Lab
Camb ridge

Hao Min
-

Auto
-
ID Lab Fudan

John Williams


http://web.mit.edu/auto
-
id/www/










Page
3
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s_miles@mit.edu


“Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College

RFID for Identification, Location and
Telemetry

Ch 2. RFID Technology and its Applications

Sanjay Sarma, Auto
-
ID Labs at MIT

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4
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s_miles@mit.edu


“Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College

Optimizing RFID chip performance

Ch. 3 RFID tag performance optimization: a chip perspective

Hao Min, Director, Auto
-
ID Labs at Fudan University

Ant
1
Ant
2
Rect
.
Rect
Modu
-
lator
Modu
-
lator
ESD
Clock
Bias
Regu
-
lator
Env
.
Detector
POR
Base
-
band
and
Memory
n
Tag Chip
RF
Analog
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5
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s_miles@mit.edu


“Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College

Testing RFID


HF/UHF/FF/NF

Ch. 4 Resolution and Integration of HF & UHF

Marlin Mickle, RFID Center of Excellence,
University of Pittsburgh

Page
6
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s_miles@mit.edu


“Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College

Integrating Sensors with RFID

Ch. 5 Integrating Sensors and Actuators

into RFID Tags , Kang Lee, NIST

Page
7
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s_miles@mit.edu


“Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College

Testing RTLS Systems

Ch. 6
Performance Evaluation of WiFi RFID

Localization Technologies Kaveh Pahlavan WISC, WPI

Page
8
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s_miles@mit.edu


“Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College

Modeling Supply Chain Network Traffic

Ch 7.
Modeling Supply Chain Network Traffic

John Williams, Director, Auto
-
ID Labs

Page
9
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s_miles@mit.edu


“Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College

Active Tag Deployment Security Issues

Ch. 8 Deployment Considerations for Active RFID
Systems, Gisele Bennett, Director EOSL, GaTech

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Page
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s_miles@mit.edu


“Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College

Testing tag read rates across portals

Ch. 9
RFID in the Retail Supply Chain: Issues and

Opportunities, Bill Hardgrave Director ITRI, UArk

Tag Read Example
83.33%
100%
60%
20%
73%
10%
60%
0.00%
10.00%
20.00%
30.00%
40.00%
50.00%
60.00%
70.00%
80.00%
90.00%
100.00%
Tag 1
Tag 2
Tag 3
Tag 4
Tag 5
Tag 6
Tag 7
Read Rate
Page
11
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s_miles@mit.edu


“Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College

Tag User Memory Encoding
-

Aerospace

Ch.10 Reducing Barriers to ID System Adoption in the Aerospace

Industry: the Aerospace ID Technologies Programme,

Duncan McFarlane, Dir AutoID Labs Cambridge Univeristy

Page
12
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s_miles@mit.edu


“Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College

The Cold Chain

Ch. 11
The Cold Chain

Jean
-
Pierre Emond, Co
-
Director Center for Food

Distribution and retailing, University of Florida

Page
13
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s_miles@mit.edu


“Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College

Anti
-
counterfeiting EPC network scenario

Ch. 12 The Application of RFID as Anticounterfeiting Technique:

Issues & Opportunities, Florian Michahelles, Assoc Director

Auto
-
ID Labs ETH Zurich

Manufacturer
EPC
-
IS
EPC
-
IS
Distributor
Checkpoint
Anti
-
Counterfeiting
Application
Discovery Service
(
DS
)
Certificate
Authority
(
CA
)
Produced t
0
Shipped t
1
Received t
2
Shipped t
3
Object
-
Specific
Security Service
Secret key k
1
Feature f
1
Address Update
Address Update
Product
with EPC
Physical flow of product
EPC
Challenge
Response
Reader
Middleware
1
.
DS query
(
EPC

list
{
URIs
}
)
2
.
Mutual authentication against CA
;
EPC
-
IS query
(
EPC

event
)
3
.
Mutual authentication against CA
;

Object
authentication protocol

(
EPC

Ch
allenge
/
Resp
onse


Result
)
(
EPC


object
-
specific F
eature

Result
)
Reader
Middleware
Reader
Middleware
Store Event
Store Event
EPC
EPC
Feature
Address Update
3
2
2
1
Page
14
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s_miles@mit.edu


“Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College

Product Lifecycle Management EID’s

Ch. 13
Closing Product Information Loops with

Product Embedded Information Devices

Dimitris Kiritsis, STI
-
IPR
-
LICP, EPFL Lausanne

Page
15
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s_miles@mit.edu


“Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College

Intelligent Material Handling

Ch 14.
Moving from RFID to Autonomous Cooperating

Logistic Processes, Dieter Ucklemann, DISA, Univ of Bremen

Page
16
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s_miles@mit.edu


“Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College

Resources:

MIT Auto
-
ID Labs Open Source EPCIS


Conclusion, Stephen Miles, Auto
-
ID Labs

Page
17
,
s_miles@mit.edu


“Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College

Resources:

MIT/SAP Research EPC Network Simulator

Page
18
,
s_miles@mit.edu


“Evolution of an RFID Revolution;”, AIDC 100 Conference, October 15, 2008 Merrimack College

Auto
-
ID Labs around the world

-

architecting an Internet of Things.