PXI Test Solutions- Capabilities and Applications

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A tradition of excellence

May
2012

PXI Test Solutions
-

Capabilities and Applications

2

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
PXI for semiconductor test applications



PXI for board and system level test applications



Discussion / demo

Agenda

2

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
OEMs
, packaging / test vendors & fabless semiconductor vendors
need to their lower
test costs


Test share of IC cost continues to decline


PXI
capabilities: Flexible
and cost effective solutions for digital , mixed
-
signal, and RF test

Semiconductor Market & Trends

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Tests Requirements

Prototype,
Pilot Phase
:, Design
Verification
Tests, Failure Analysis

Test throughput


DC parametric


Functional

Devices tested / characterized

Test system & cost


Production Test:

Test for process induced faults

Extensive, multiple files / vectors

Limited or complete test,
depending on customer /
application

Minutes to hours, single device
testing

10
’s to
1000
’s

In
-
house or PXI
-
based


$
50
K
-

$
100
K typical

Limited, test time constrained

All pins checked for DC parameters

Seconds, may require multi
-
site testing

1000
’s to millions

Production IC Test System

$
500
K and up

Semiconductor Test Requirements

PXI Components


& Systems

“Big Iron” ATE

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
Cost effective


Product capabilities: high performance
instrumentation and bus bandwidth


Flexible & robust open architecture


Wide market adoption
–

drives product development
and pricing

Why PXI for Semiconductor ATE?

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
Timing / Synchronization

–
Triggering and clocking resources for coherent mixed signal testing


Bus bandwidth

–
2
GB/s data rate per slot

–
Peer to peer communication for high speed data processing


Software
–

Flexibility & Open Architecture

–
Windows based environment supports many APIs
-
COM
, VB,
LabVIEW
,
.Net
, C, etc.

–
Users can select from off the shelf test executives or create their own

–
Third party and OEM software tools for importing and converting
digital test vectors
–

i.e. STIL, WGL, VCD

PXI Architecture
–

A Robust Standard for ATE

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
Multiple vendors offering performance digital
instrumentation



200
MHz vector rate with PMU per pin and per pin
programmability


High channel density:
32
channels per card,
512
channels in a
single
3
U PXI chassis


Cost effective: $
250
/ channel


User FPGA cards for custom interfaces

PXI Products for Semiconductor ATE
-

Digital Test

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PXI Digital Instrumentation

for Parametric and Functional Test

PMU or SMU

(Source / Measure Unit)

Multiplexer

/

Switch


Digital

Instrument

•

100
MHz


Power

Supply

•

Combining the digital and PMU :

•

Faster test time

•

Lower
cost

•
Eliminates switching

GX
5295

•

-
2
to +
7
Drive / Sense

•

Terminations: PU / PD

•

3
state drive

•

Real time compare

DUT

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
Verify functionality

–
Generate or import test vectors

–
Test vectors can be large (megabytes)
-

requires deep memory



Verify DC parameters

–
Opens / shorts test
–

verifies fixture
/ UUT connection

–
Input and output characteristics

–
Sink / source currents and voltages
for all signal pins



Maximize test throughput

–
Real
-
time compare for digital test

–
“Per
-
pin” DC measurement
(parametric measurement unit or
PMU)

Semiconductor Test
–

Using PXI Instrumentation

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Applications
–

Device Characterization

V
-
I Curve Characterization &
Output Loading Tests

•
Parallel measurement

•
Fast with PMU per pin

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
Test all pins on
the device


Verifies shorts /
opens for the
fixture and DUT


Checks
protection
diodes


Lengthy process
if testing one
pin at a time

Basic Opens / Shorts / Contact Test

* Excerpt from “The Fundamentals of Digital Semiconductor Testing”, Guy Perry

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
Output voltage test
–

VOH, IOH


Set DUT VDD to min


Set DUT output to a “
1
” state


Set PMU IOH to specified load current


Measure output voltage level (compare against DUT’s specification)


PMU for measuring input currents and voltages

DC Parametric Testing for a Device

* Excerpt from “The Fundamentals of Digital Semiconductor Testing”, Guy Perry

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
Vector generation is typically created by designers and then
imported to the digital test instrumentation


Test vector formats:

–
ASCII

–
WGL, STIL, VCD/
eVCD

–
Proprietary ATE tester formats, (Teradyne J
750
,
Verigy
, etc.)


Tests can require millions of vectors.

–
Real
-
time compare allows you to test each response in real time or
“don’t care” each vector
–

very fast test process.

–
At the end of test simply check the “pass / fail” result

–
Additional small error memory available for logging errors

Functional Testing (Digital Tests)

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
Instrumentation & Systems:

–
Static, dynamic & FPGA digital
instrumentation

–
SMU or PMU (parametric
measurement unit)

–
Preconfigured PXI systems for
digital and mixed signal test


Software

–
Vector conversion tools

–
Digital waveform display / edit

–
Test executive

PXI Instrumentation & Systems for
Semiconductor Test

14

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Advanced
Semiconductor Test Tools


Device Pin and Pin group mapping
capability
–

simplifies test program
development and reuse


Pre
-
defined DC Parametric tests:

•
Open and Shorts

•
Input Leakage (IIL, IIH)

•
Input Voltage Threshold (VIH, VIL)

•
Output Short Circuit (IOSH, IOSL)

•
Output Voltage Threshold (VOH, VOL)

•
Power Consumption (IDD, IDDQ)

–
I
-
V Curve test capability
-

Automated
and interactive Tool

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Semiconductor Test Tools

(cont’d)


Shmoo

plot tool
–

Automated and interactive

–
Automated characterization of devices over a range of operating
conditions

–
Standard feature for “big iron” ATE platforms


Simplifies design verification effort

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Example: PXI System for Semiconductor Test

512
digital channels

100
MHz, DIO Cards
with PMU per pin

User power


Static DIO Card

Core
2
Duo Controller

High
Performance,
Modular
Integrated
Receiver

Extra slots for

Analog / mixed
-
signal test

applications

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
Multiple vendors producing high
performance digitizers and waveform
generators


Time interval analyzer for jitter and fast
frequency measurement


SMUs & power supplies for DPS applications


RF instrumentation

Additional PXI Products for Semiconductor Test

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
Test a serial communication controller with high voltage isolation
(
2500
V) , used for smart grid applications


Requirement: Lower cost, smaller footprint solution needed


Test requirements:

–
Support
16
digital channels with PMU capability with vector rates of >
20
MHz

–
Tools to import and convert WGL vector files

–
Analog instrumentation

–

Characterization and production test

Application Example

20

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Detailed Requirements / Solution

Customer Requirement

/ Specification

PXI

Based Solution

1.

560V
-

2500V DC signal preferably without any
external power supplies for transformer isolation and
functional testing


12 bit PXI based ADC board and DAC board interfaced with
custom bus based proprietary intelligent signal conditioning
high voltage VI board

2

Multiple power supplies up to 5V, 5A

12 bit PXI based ADC board plus DAC board interfaced with
custom bus based proprietary intelligent signal conditioning
VI board

3

16 Digital channels with vectors pattern drive and
strobe capability with data rate more than 20MHZ
and with deep memory for Functional testing.

Geotest GX5295, 32 DIO & PMU card with 256MB of on
board vector memory.

4

12 bit or better PMU for DC and parametric testing

5

Very low leakage current measurement in ‘pico
Amps’.

PXI based 6.5 DMM with signal amplifier board.

6

8 bit or better high speed digitizing capability with
deep on board memory for skew and switching
characteristics testing

PXI based 100MHZ, 100MS/s high speed
digitizer

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
Test application required multiple digital channels
with PMU

•
GX
5295
is a cost
-
effective solution for this requirement with
per pin PMU


Customer was looking to reduce size, power and
cost of system

•
PXI platform helped achieve these goals

•
3
:
1
size reduction,
3
:
1
power reduction,
3
:
1
cost reduction


Customer was looking for a high throughput solution

•
The driver and PMU performance have been optimized to
meet the customer’s requirements

Key Success Factors

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
Overview of the GBATS PXI platform



Addressing test applications with preconfigured PXI system
solutions

Board and System Level Applications

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GBATS: Geotest Basic Automated Test System


Preconfigured system for board and
system level test

–
PXI based, accepts
6
U and
3
U modules

–
19
inch rack mountable,
6
U high

–
Compact footprint

–
Faster test development and deployment



Outstanding “functional density”

–
6
U and
3
U modules offer a variety of functions and
features



Includes an engineered mass
termination cable interface, based on
the Virginia Panel
iCON

interface

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An engineered platform with common
infrastructure for all configurations



Chassis


UUT interface


Self
-
test software / hardware


User power supply


Boundary
-
Scan


Avionics interfaces


Static or Dynamic Digital I/O


General purpose analog measurements

Over
20
different standard instrument options for
customizing the system without the custom costs

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System Interface: Virginia Panel
iCON

960


960
pin interface


Zero insertion force, rugged interface for
cable interfacing


System PCB assembly interfaces
iCON

to all
system resources using COTS cables


Option to add additional power / coax
interface via additional connector

One Common Interface for ALL configurations

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System PCB
assembly interfaces
iCON to all system
resources using
COTS cables


Option to add
additional power /
coax connections via
additional connector

System
Interface

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
All GBATS systems supplied with system self
-
test


Functional verification of test system resources
and connections to receiver interface


Self
-
test “fixture” consists of
iCON

960 ITA and
associated wiring / passive components


ATEasy based self
-
test program (executable)
–

does NOT require ATEasy license to execute


ATEasy source code is supplied with system


System Self
-
Test

iCON
960
ITA

Self
-
Test Fixture

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
TS
-
710
–

Basic Functional Test Platform

–
Entry level, basic analog/ digital test applications

–
Static digital, low frequency analog


TS
-
720
–

Functional &Boundary Scan Test Platform

–
Basic functional and structural test applications

–
Supports CPLD and flash programming


TS
-
730
–

Mixed
-
Signal Test Platform

–
Performance analog and digital test capabilities

–
Supports up to
200
MHz digital test rate

–
Component, module or system level mixed
-
signal
test

Application Focused, Preconfigured Test Platforms

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
TS
-
750
–

Digital Test Platform

–
Performance digital test capabilities

–
Up to 128, 200 MHz, digital channels

–
Component or board level test

–
LASAR conversion tools (option)


TS
-
770
–

Commercial Avionics Test Platform

–
Analog and digital test support

–
ARINC
-
429 interface supports control / testing of
commercial avionics LRU/SRUs and sub
-
assemblies


TS
-
775
–

Military Avionics Test Platform

–
Analog and digital test support

–
MIL
-
STD 1553A/B interface supports control / testing
of military avionics LRU/SRUs and sub
-
assemblies


Application Focused, Preconfigured Test Platforms
(cont’d)

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TS
-
710
: Base System Configuration


Controller w/ USB, Gig Ethernet, RS
-
232
,

PMC card with analog & digital resources



Spare

GX
2065
-

DMM

GX
7102
A
6
U/
3
U
Smart
PXI Chassis

(
19
inch rack mount)

Spare

6
U of

Rack Space

Spare

Spare

Spare

GX6377 mux,relay


Spare

GX
5733
–

Dig. I/O

GX
7404
-
Power Sup.



Spare



Spare



Spare

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TS
-
710
Core System Components


GX
7100
A Chassis


–
7 6
U,
7 3
U slots

–
Smart features
–

temperature, system power, & fan
monitoring; software mapping of trigger lines

–
Single slot controller with standard I/O ports

–
Built
-
in peripherals

Additional

Peripherals on Rear

Usb, Ethernet , Serial…

Single slot controller

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TS
-
710
Core Components Analog Instrumentation

General Purpose Digital / Analog
Resource Module

•
PMC module located on
embedded controller

•
8 digital I/O (for adapter ID)

•
(4) 16 bit D to As & (8) 16 bit A to
Ds

•
+/
-

10 volt input / output

•
300 KS/s aggregate sampling rate
for A to Ds and D to As

•
Prototyping area for


custom circuit development

•
Access to PXI +
3.3
, +
5
, +
12
and
–
12
volts output voltages

•
Software controlled on/off switching
of output voltages

•
Fused outputs
3.3
/
5
:
2
amp;
12
/
-
12
:
0.5
amp

•
Voltage and current read back

•
External power inhibit line

GX
7404
User Supply

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TS
-
710
Core Components
Analog Instrumentation

•
Digital
Multimeter

•
6
½ digit model

•
Up to
1
,
400
readings per second

•
AC and DC Voltage, current

•
Resistance, Diodes , dB ,
Min/Max


Measurement Options:

•
Capacitance, inductance,
leakage, temperature, Frequency,
period
…

Digital
Multimeter

–

GX2065

Multifunction switch card
-

GX
6377

•
5
ch
,
10
amp, form A relays

•
4
ch
,
2
amp, form A relays

•
4
ch
,
2
amp, form C relays

•
Two,
16
x
2
switch matrices
-

0.5
A ,
200
VDC

•
Matrices can be configured as a
32
x
2
or
16
x
4

•
Very unique and flexible switch
card



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•
Modular digital I/O card with a
total of
128
I/O channels

•
Can accommodate one I/O
modules to achieve custom I/O
levels and functions

•
96
have TTL levels, and the
direction of each group of eight
channels can be programmed
as input or output

GX
5733

GX
57
XX
–

Option Modules


Advanced Static Digital I/O Interface

•
GX5701 Digital Input Latch (DIL)

•
GX5702 Digital Output Latch (DOL)

•
GX5704 Digital Power Output latch (DPO)

•
GX5709 Differential Digital I/O (DDIO)*

•
GX5712 RS
-
422 to TTL (RTT16)*


TS
-
710
Core Components
–

Digital
I/O

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System Software
-

ATEasy



Each system supplied with self
-
test
executable


Instrument drivers for C,
LabVIEW
, CVI, etc.


Full
–

Featured Test executive and test
development environment

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
Power
-
up Built
-
in Test (BIT) :

•
Executes unconditionally
on system power
-
on to
verify basic system
integrity.


TS
-
700
Calibration Verification
Program:

•
Implemented during BIT to
verify the calibration dates
on the system instruments
that require calibration.


GBATS BIT and Cal
-
Ver Programs

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
Checksum Test:

–
Checks the integrity of the key
software programs.


System Self
-
Test

–
Functional verification of test system
resources and connections to receiver
interface

–
Self
-
test “fixture” consists of iCon
960
ITA and associated wiring / passive
components

–
ATEasy based self
-
test program
(executable)
–

only requires free
ATEasy run
-
time license to execute.

–
ATEasy source code is supplied



GBATS Checksum and Self
-
Test Programs

Self
-
Test Fixture

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
Manufacturer of LED municipal
street lighting



Test requirements:

–
Functionally test power
supply


for LED lighting

–
Turn key solution

–
Test a PCB panel with
8

UUT’s

–
Integrated into a handler


BlueSpan Lighting Portugal
–


GBATS Application

40

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
Standard GBATS TS
-
710
and ATEasy

–
Additional GX
6315

–
Additional Pickering high voltage
switching card (
24
x SPST,
1000
V)


Chroma C
6404
AC source


Resistor load box


Integrated with a
MyAutomation

test
handler


BlueSpan: Final configuration

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Integrated System (with handler)

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
Korry

787
Flight Deck Control
Panel Test Set


Requirements
:


•
Self
-
contained, bench
-
top tester for
testing
50
different Boeing
787
instrument panels

•
Programmable power supplies

•
Switching

•
CAN communications interface

•
Mass cable interconnect

Example
–

GX7100 Based System

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
Teledyne Controls

•
Test systems for Flight Data
Acquisition and Management units
(FDMU)

•
GX
7100
A based platform

•
DMM, switching, GX
1838
, ARINC
-
429
interface

•
ATEasy software

•
Goal is to use one test system for all
of their unit level products

•
Requirement was for a compact
system, small footprint and ability to
add UUT power


GX
7100
–
Based System

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Task

PC
-

Based

GBATS

Test Resources selection

More time

Less

time

UUT test interface definition

More time

No time

System structure definition

More time

No time

System H/W design (wiring, mechanical)

More time

No time

System S/W design (drivers, system, etc.)

More time

No time

System software install/
config

More time

No time

Self
-
test design (electrical/mechanical)

More time

No time

Self
-
test coding

More time

No time

Self test integration/debug

More time

No time

Build versus Buy Considerations
–

Where will
you spend your time ?


Substantial time will be devoted to developing and integrating a custom solution

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
Analyze the time and labor required to develop a custom
solution

–
Development time can easily exceed the acquisition cost
of a lower priced in
-
house solution

–
A GBATS solution can offer a lower total cost compared to
the in
-
house solution or custom solution


Multiple applications increases the GBATS advantage

–
GBATS is well suited for multiple applications

–
VPC
iCON

interface is ideal for TPS applications


Additional
tangible and intangible advantages

–
Time to market

–
Serviceability and maintainability

–

Production quality solution
–

reliable and rugged


Custom versus GBATS solution

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
PXI instrumentation and systems can offer
cost effective solutions for digital and mixed
-
signal semiconductor test



GBATS
offers high performance, down
-
sized
solutions for
board and system level test

–
Flexible
, modular,
off
-
the
-
shelf
architecture
with a full
-
featured test
executive / test development software
platform

–
Wide
selection of instrument options with
an integrated high density receiver
interface



Cost effective
–

PXI
-
based custom
configurations without the custom costs





Summary

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
Discussion / Questions

Thank You!