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A tradition of excellence
May
2012
PXI Test Solutions
-
Capabilities and Applications
2
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PXI for semiconductor test applications
PXI for board and system level test applications
Discussion / demo
Agenda
2
3
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OEMs
, packaging / test vendors & fabless semiconductor vendors
need to their lower
test costs
Test share of IC cost continues to decline
PXI
capabilities: Flexible
and cost effective solutions for digital , mixed
-
signal, and RF test
Semiconductor Market & Trends
4
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Tests Requirements
Prototype,
Pilot Phase
:, Design
Verification
Tests, Failure Analysis
Test throughput
DC parametric
Functional
Devices tested / characterized
Test system & cost
Production Test:
Test for process induced faults
Extensive, multiple files / vectors
Limited or complete test,
depending on customer /
application
Minutes to hours, single device
testing
10
’s to
1000
’s
In
-
house or PXI
-
based
$
50
K
-
$
100
K typical
Limited, test time constrained
All pins checked for DC parameters
Seconds, may require multi
-
site testing
1000
’s to millions
Production IC Test System
$
500
K and up
Semiconductor Test Requirements
PXI Components
& Systems
“Big Iron” ATE
5
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Cost effective
Product capabilities: high performance
instrumentation and bus bandwidth
Flexible & robust open architecture
Wide market adoption
–
drives product development
and pricing
Why PXI for Semiconductor ATE?
6
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Timing / Synchronization
–
Triggering and clocking resources for coherent mixed signal testing
Bus bandwidth
–
2
GB/s data rate per slot
–
Peer to peer communication for high speed data processing
Software
–
Flexibility & Open Architecture
–
Windows based environment supports many APIs
-
COM
, VB,
LabVIEW
,
.Net
, C, etc.
–
Users can select from off the shelf test executives or create their own
–
Third party and OEM software tools for importing and converting
digital test vectors
–
i.e. STIL, WGL, VCD
PXI Architecture
–
A Robust Standard for ATE
7
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Multiple vendors offering performance digital
instrumentation
200
MHz vector rate with PMU per pin and per pin
programmability
High channel density:
32
channels per card,
512
channels in a
single
3
U PXI chassis
Cost effective: $
250
/ channel
User FPGA cards for custom interfaces
PXI Products for Semiconductor ATE
-
Digital Test
8
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PXI Digital Instrumentation
for Parametric and Functional Test
PMU or SMU
(Source / Measure Unit)
Multiplexer
/
Switch
Digital
Instrument
•
100
MHz
Power
Supply
•
Combining the digital and PMU :
•
Faster test time
•
Lower
cost
•
Eliminates switching
GX
5295
•
-
2
to +
7
Drive / Sense
•
Terminations: PU / PD
•
3
state drive
•
Real time compare
DUT
9
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Verify functionality
–
Generate or import test vectors
–
Test vectors can be large (megabytes)
-
requires deep memory
Verify DC parameters
–
Opens / shorts test
–
verifies fixture
/ UUT connection
–
Input and output characteristics
–
Sink / source currents and voltages
for all signal pins
Maximize test throughput
–
Real
-
time compare for digital test
–
“Per
-
pin” DC measurement
(parametric measurement unit or
PMU)
Semiconductor Test
–
Using PXI Instrumentation
10
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Applications
–
Device Characterization
V
-
I Curve Characterization &
Output Loading Tests
•
Parallel measurement
•
Fast with PMU per pin
11
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Test all pins on
the device
Verifies shorts /
opens for the
fixture and DUT
Checks
protection
diodes
Lengthy process
if testing one
pin at a time
Basic Opens / Shorts / Contact Test
* Excerpt from “The Fundamentals of Digital Semiconductor Testing”, Guy Perry
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Output voltage test
–
VOH, IOH
Set DUT VDD to min
Set DUT output to a “
1
” state
Set PMU IOH to specified load current
Measure output voltage level (compare against DUT’s specification)
PMU for measuring input currents and voltages
DC Parametric Testing for a Device
* Excerpt from “The Fundamentals of Digital Semiconductor Testing”, Guy Perry
13
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Vector generation is typically created by designers and then
imported to the digital test instrumentation
Test vector formats:
–
ASCII
–
WGL, STIL, VCD/
eVCD
–
Proprietary ATE tester formats, (Teradyne J
750
,
Verigy
, etc.)
Tests can require millions of vectors.
–
Real
-
time compare allows you to test each response in real time or
“don’t care” each vector
–
very fast test process.
–
At the end of test simply check the “pass / fail” result
–
Additional small error memory available for logging errors
Functional Testing (Digital Tests)
14
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Instrumentation & Systems:
–
Static, dynamic & FPGA digital
instrumentation
–
SMU or PMU (parametric
measurement unit)
–
Preconfigured PXI systems for
digital and mixed signal test
Software
–
Vector conversion tools
–
Digital waveform display / edit
–
Test executive
PXI Instrumentation & Systems for
Semiconductor Test
14
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Advanced
Semiconductor Test Tools
Device Pin and Pin group mapping
capability
–
simplifies test program
development and reuse
Pre
-
defined DC Parametric tests:
•
Open and Shorts
•
Input Leakage (IIL, IIH)
•
Input Voltage Threshold (VIH, VIL)
•
Output Short Circuit (IOSH, IOSL)
•
Output Voltage Threshold (VOH, VOL)
•
Power Consumption (IDD, IDDQ)
–
I
-
V Curve test capability
-
Automated
and interactive Tool
16
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Semiconductor Test Tools
(cont’d)
Shmoo
plot tool
–
Automated and interactive
–
Automated characterization of devices over a range of operating
conditions
–
Standard feature for “big iron” ATE platforms
Simplifies design verification effort
17
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Example: PXI System for Semiconductor Test
512
digital channels
100
MHz, DIO Cards
with PMU per pin
User power
Static DIO Card
Core
2
Duo Controller
High
Performance,
Modular
Integrated
Receiver
Extra slots for
Analog / mixed
-
signal test
applications
18
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Multiple vendors producing high
performance digitizers and waveform
generators
Time interval analyzer for jitter and fast
frequency measurement
SMUs & power supplies for DPS applications
RF instrumentation
Additional PXI Products for Semiconductor Test
19
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Test a serial communication controller with high voltage isolation
(
2500
V) , used for smart grid applications
Requirement: Lower cost, smaller footprint solution needed
Test requirements:
–
Support
16
digital channels with PMU capability with vector rates of >
20
MHz
–
Tools to import and convert WGL vector files
–
Analog instrumentation
–
Characterization and production test
Application Example
20
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Detailed Requirements / Solution
Customer Requirement
/ Specification
PXI
Based Solution
1.
560V
-
2500V DC signal preferably without any
external power supplies for transformer isolation and
functional testing
12 bit PXI based ADC board and DAC board interfaced with
custom bus based proprietary intelligent signal conditioning
high voltage VI board
2
Multiple power supplies up to 5V, 5A
12 bit PXI based ADC board plus DAC board interfaced with
custom bus based proprietary intelligent signal conditioning
VI board
3
16 Digital channels with vectors pattern drive and
strobe capability with data rate more than 20MHZ
and with deep memory for Functional testing.
Geotest GX5295, 32 DIO & PMU card with 256MB of on
board vector memory.
4
12 bit or better PMU for DC and parametric testing
5
Very low leakage current measurement in ‘pico
Amps’.
PXI based 6.5 DMM with signal amplifier board.
6
8 bit or better high speed digitizing capability with
deep on board memory for skew and switching
characteristics testing
PXI based 100MHZ, 100MS/s high speed
digitizer
21
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om
Test application required multiple digital channels
with PMU
•
GX
5295
is a cost
-
effective solution for this requirement with
per pin PMU
Customer was looking to reduce size, power and
cost of system
•
PXI platform helped achieve these goals
•
3
:
1
size reduction,
3
:
1
power reduction,
3
:
1
cost reduction
Customer was looking for a high throughput solution
•
The driver and PMU performance have been optimized to
meet the customer’s requirements
Key Success Factors
22
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Overview of the GBATS PXI platform
Addressing test applications with preconfigured PXI system
solutions
Board and System Level Applications
23
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GBATS: Geotest Basic Automated Test System
Preconfigured system for board and
system level test
–
PXI based, accepts
6
U and
3
U modules
–
19
inch rack mountable,
6
U high
–
Compact footprint
–
Faster test development and deployment
Outstanding “functional density”
–
6
U and
3
U modules offer a variety of functions and
features
Includes an engineered mass
termination cable interface, based on
the Virginia Panel
iCON
interface
24
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An engineered platform with common
infrastructure for all configurations
Chassis
UUT interface
Self
-
test software / hardware
User power supply
Boundary
-
Scan
Avionics interfaces
Static or Dynamic Digital I/O
General purpose analog measurements
Over
20
different standard instrument options for
customizing the system without the custom costs
25
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System Interface: Virginia Panel
iCON
960
960
pin interface
Zero insertion force, rugged interface for
cable interfacing
System PCB assembly interfaces
iCON
to all
system resources using COTS cables
Option to add additional power / coax
interface via additional connector
One Common Interface for ALL configurations
26
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2013
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System PCB
assembly interfaces
iCON to all system
resources using
COTS cables
Option to add
additional power /
coax connections via
additional connector
System
Interface
27
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2013
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All GBATS systems supplied with system self
-
test
Functional verification of test system resources
and connections to receiver interface
Self
-
test “fixture” consists of
iCON
960 ITA and
associated wiring / passive components
ATEasy based self
-
test program (executable)
–
does NOT require ATEasy license to execute
ATEasy source code is supplied with system
System Self
-
Test
iCON
960
ITA
Self
-
Test Fixture
28
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TS
-
710
–
Basic Functional Test Platform
–
Entry level, basic analog/ digital test applications
–
Static digital, low frequency analog
TS
-
720
–
Functional &Boundary Scan Test Platform
–
Basic functional and structural test applications
–
Supports CPLD and flash programming
TS
-
730
–
Mixed
-
Signal Test Platform
–
Performance analog and digital test capabilities
–
Supports up to
200
MHz digital test rate
–
Component, module or system level mixed
-
signal
test
Application Focused, Preconfigured Test Platforms
29
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TS
-
750
–
Digital Test Platform
–
Performance digital test capabilities
–
Up to 128, 200 MHz, digital channels
–
Component or board level test
–
LASAR conversion tools (option)
TS
-
770
–
Commercial Avionics Test Platform
–
Analog and digital test support
–
ARINC
-
429 interface supports control / testing of
commercial avionics LRU/SRUs and sub
-
assemblies
TS
-
775
–
Military Avionics Test Platform
–
Analog and digital test support
–
MIL
-
STD 1553A/B interface supports control / testing
of military avionics LRU/SRUs and sub
-
assemblies
Application Focused, Preconfigured Test Platforms
(cont’d)
30
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TS
-
710
: Base System Configuration
Controller w/ USB, Gig Ethernet, RS
-
232
,
PMC card with analog & digital resources
Spare
GX
2065
-
DMM
GX
7102
A
6
U/
3
U
Smart
PXI Chassis
(
19
inch rack mount)
Spare
6
U of
Rack Space
Spare
Spare
Spare
GX6377 mux,relay
Spare
GX
5733
–
Dig. I/O
GX
7404
-
Power Sup.
Spare
Spare
Spare
31
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2013
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TS
-
710
Core System Components
GX
7100
A Chassis
–
7 6
U,
7 3
U slots
–
Smart features
–
temperature, system power, & fan
monitoring; software mapping of trigger lines
–
Single slot controller with standard I/O ports
–
Built
-
in peripherals
Additional
Peripherals on Rear
Usb, Ethernet , Serial…
Single slot controller
32
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2013
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TS
-
710
Core Components Analog Instrumentation
General Purpose Digital / Analog
Resource Module
•
PMC module located on
embedded controller
•
8 digital I/O (for adapter ID)
•
(4) 16 bit D to As & (8) 16 bit A to
Ds
•
+/
-
10 volt input / output
•
300 KS/s aggregate sampling rate
for A to Ds and D to As
•
Prototyping area for
custom circuit development
•
Access to PXI +
3.3
, +
5
, +
12
and
–
12
volts output voltages
•
Software controlled on/off switching
of output voltages
•
Fused outputs
3.3
/
5
:
2
amp;
12
/
-
12
:
0.5
amp
•
Voltage and current read back
•
External power inhibit line
GX
7404
User Supply
33
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TS
-
710
Core Components
Analog Instrumentation
•
Digital
Multimeter
•
6
½ digit model
•
Up to
1
,
400
readings per second
•
AC and DC Voltage, current
•
Resistance, Diodes , dB ,
Min/Max
Measurement Options:
•
Capacitance, inductance,
leakage, temperature, Frequency,
period
…
Digital
Multimeter
–
GX2065
Multifunction switch card
-
GX
6377
•
5
ch
,
10
amp, form A relays
•
4
ch
,
2
amp, form A relays
•
4
ch
,
2
amp, form C relays
•
Two,
16
x
2
switch matrices
-
0.5
A ,
200
VDC
•
Matrices can be configured as a
32
x
2
or
16
x
4
•
Very unique and flexible switch
card
34
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•
Modular digital I/O card with a
total of
128
I/O channels
•
Can accommodate one I/O
modules to achieve custom I/O
levels and functions
•
96
have TTL levels, and the
direction of each group of eight
channels can be programmed
as input or output
GX
5733
GX
57
XX
–
Option Modules
Advanced Static Digital I/O Interface
•
GX5701 Digital Input Latch (DIL)
•
GX5702 Digital Output Latch (DOL)
•
GX5704 Digital Power Output latch (DPO)
•
GX5709 Differential Digital I/O (DDIO)*
•
GX5712 RS
-
422 to TTL (RTT16)*
TS
-
710
Core Components
–
Digital
I/O
35
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System Software
-
ATEasy
Each system supplied with self
-
test
executable
Instrument drivers for C,
LabVIEW
, CVI, etc.
Full
–
Featured Test executive and test
development environment
36
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2013
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Power
-
up Built
-
in Test (BIT) :
•
Executes unconditionally
on system power
-
on to
verify basic system
integrity.
TS
-
700
Calibration Verification
Program:
•
Implemented during BIT to
verify the calibration dates
on the system instruments
that require calibration.
GBATS BIT and Cal
-
Ver Programs
37
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om
Checksum Test:
–
Checks the integrity of the key
software programs.
System Self
-
Test
–
Functional verification of test system
resources and connections to receiver
interface
–
Self
-
test “fixture” consists of iCon
960
ITA and associated wiring / passive
components
–
ATEasy based self
-
test program
(executable)
–
only requires free
ATEasy run
-
time license to execute.
–
ATEasy source code is supplied
GBATS Checksum and Self
-
Test Programs
Self
-
Test Fixture
39
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2013
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Manufacturer of LED municipal
street lighting
Test requirements:
–
Functionally test power
supply
for LED lighting
–
Turn key solution
–
Test a PCB panel with
8
UUT’s
–
Integrated into a handler
BlueSpan Lighting Portugal
–
GBATS Application
40
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om
Standard GBATS TS
-
710
and ATEasy
–
Additional GX
6315
–
Additional Pickering high voltage
switching card (
24
x SPST,
1000
V)
Chroma C
6404
AC source
Resistor load box
Integrated with a
MyAutomation
test
handler
BlueSpan: Final configuration
41
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2013
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Integrated System (with handler)
42
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Korry
787
Flight Deck Control
Panel Test Set
Requirements
:
•
Self
-
contained, bench
-
top tester for
testing
50
different Boeing
787
instrument panels
•
Programmable power supplies
•
Switching
•
CAN communications interface
•
Mass cable interconnect
Example
–
GX7100 Based System
43
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Teledyne Controls
•
Test systems for Flight Data
Acquisition and Management units
(FDMU)
•
GX
7100
A based platform
•
DMM, switching, GX
1838
, ARINC
-
429
interface
•
ATEasy software
•
Goal is to use one test system for all
of their unit level products
•
Requirement was for a compact
system, small footprint and ability to
add UUT power
GX
7100
–
Based System
44
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om
Task
PC
-
Based
GBATS
Test Resources selection
More time
Less
time
UUT test interface definition
More time
No time
System structure definition
More time
No time
System H/W design (wiring, mechanical)
More time
No time
System S/W design (drivers, system, etc.)
More time
No time
System software install/
config
More time
No time
Self
-
test design (electrical/mechanical)
More time
No time
Self
-
test coding
More time
No time
Self test integration/debug
More time
No time
Build versus Buy Considerations
–
Where will
you spend your time ?
Substantial time will be devoted to developing and integrating a custom solution
45
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om
Analyze the time and labor required to develop a custom
solution
–
Development time can easily exceed the acquisition cost
of a lower priced in
-
house solution
–
A GBATS solution can offer a lower total cost compared to
the in
-
house solution or custom solution
Multiple applications increases the GBATS advantage
–
GBATS is well suited for multiple applications
–
VPC
iCON
interface is ideal for TPS applications
Additional
tangible and intangible advantages
–
Time to market
–
Serviceability and maintainability
–
Production quality solution
–
reliable and rugged
Custom versus GBATS solution
46
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2013
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PXI instrumentation and systems can offer
cost effective solutions for digital and mixed
-
signal semiconductor test
GBATS
offers high performance, down
-
sized
solutions for
board and system level test
–
Flexible
, modular,
off
-
the
-
shelf
architecture
with a full
-
featured test
executive / test development software
platform
–
Wide
selection of instrument options with
an integrated high density receiver
interface
Cost effective
–
PXI
-
based custom
configurations without the custom costs
Summary
47
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Discussion / Questions
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