SETNET MEETING - The Cost of Test

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The Cost of Test

Semiconductor Test

Consumer Business Unit

SLIDE
1

SETNET MEETING
-

The Cost of Test


Thursday 21 February

2002

TUC Congress Centre
, London

Chris Brown

Sales Engineer


Teradyne Inc.

WWW.TERADYNE.COM/INTEGRA

The Cost of Test
-

Sept 2001

The Cost of Test

Semiconductor Test

Consumer Business Unit

SLIDE
2

The Cost of Test


What is it?


Direct Costs.


Cost of the test system.


Cost of the prober or handler.


Cost of support hardware (docking, interface
boards, probecards).



Hidden Costs.


Floorspace usage.


Uptime/Downtime (Reliability).


Cost of application support.


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The Cost of Test
-

Sept 2001

The Cost of Test

Semiconductor Test

Consumer Business Unit

SLIDE
3

Requirements of Semiconductor Manufacturers
from an ATE perspective


Performance


Price


Time To Market


Reliability


Productivity


Quality

Reduce Test Costs

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The Cost of Test
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Sept 2001

The Cost of Test

Semiconductor Test

Consumer Business Unit

SLIDE
4

Example:

The ‘non
-
memory’
-
Semiconductor Markets

PRICE PER PIN

PERFORMANCE

High Performance


CISC µProcessor

High Integration (SOC)


High Volume



RISC µProcessor


8
-
bit µController


16/32
-
bit µController


DSPs


Embedded

Controllers


Gate Arrays


PLDs/FPGAs


Modems


Graphics


Audio/Video


Chipsets


Storage


Smart
Cards

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The Cost of Test
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Sept 2001

The Cost of Test

Semiconductor Test

Consumer Business Unit

SLIDE
5

Case 1: Microcontroller Market

Range of microcontroller
performance and test
requirements are constantly
expanding



T
H
R
O
U
G
H
P
U
T


PERFORMANCE

RF

Flash

12 Bit A/D
-

D/A

8 Bit A/D
-

D/A

OTP

EEPROM

Smartcards

16/32 bit uC

8 bit uC

DRAM

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The Cost of Test
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Sept 2001

The Cost of Test

Semiconductor Test

Consumer Business Unit

SLIDE
6

Case 1: Microcontroller Market


Dropping prices and increasing volumes are pressuring micro
controller test organizations to find new solutions


Competing in the micro controller market requires:


50% reduction in test cost


Double worldwide capacity


S
H
I
P
M
E
N
T
S

1995

2000

3 Billion Units

7.3 Billion Units

2000

D
E
V
I
C
E

A
S
P

1995

$2.62

$3.41

Dataquest
-

12/00

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The Cost of Test
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Sept 2001

The Cost of Test

Semiconductor Test

Consumer Business Unit

SLIDE
7

Case 2: Smart Card Market

Millions
of USD

Source
: Dataquest 7/2000



Device ASP << 1USD

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The Cost of Test
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Sept 2001

The Cost of Test

Semiconductor Test

Consumer Business Unit

SLIDE
8

Case 2: Smart Card Market (cont.)


Lowest device cost


Highest production
volume



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The Cost of Test
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Sept 2001

The Cost of Test

Semiconductor Test

Consumer Business Unit

SLIDE
9

‘The Cost of Test’ Conclusion

Device Selling Price

Production Volume

Cost of Test


Dropping device prices
and increasing production
volume causes a strong
demand to constantly
reduce the cost of test.


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The Cost of Test
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Sept 2001

The Cost of Test

Semiconductor Test

Consumer Business Unit

SLIDE
10

Test Cost Reduction Measures from an ATE point
of view

No. 1: Parallel test

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The Cost of Test
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Sept 2001

The Cost of Test

Semiconductor Test

Consumer Business Unit

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11

No. 1: Parallel test Efficiency (
R
= 1
-

(
dt
/
dn
) / T
single
)

T
H
R
O
U
G
H
P
U
T

Sites Tested In Parallel


Analog/ parametrics tested serially


Memory test driven by slowest device


Programming tester one pin at a time

T
H
R
O
U
G
H
P
U
T

Sites Tested In Parallel


All parametrics / analog test in parallel


Memory test optimal test times


Programming tester with command per site


Devices tested asynchronously

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The Cost of Test
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Sept 2001

The Cost of Test

Semiconductor Test

Consumer Business Unit

SLIDE
12

No. 1: Parallel test


Parallel Test Efficiency

Dual site parallel test already
cuts test costs by 50%

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The Cost of Test
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Sept 2001

The Cost of Test

Semiconductor Test

Consumer Business Unit

SLIDE
13

No. 1: Parallel test


Parallel Test Efficiency

Parallel test efficiency becomes
relevant at higher site counts

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The Cost of Test
-

Sept 2001

The Cost of Test

Semiconductor Test

Consumer Business Unit

SLIDE
14

No. 1: Parallel test
-

Summary


Increasing parallel test does mean increasing throughput per tester


Parallel test has its limits based on how efficient a tester can test
sites in parallel.



Basic Principle:
HW and SW of the ATE instrument needs to be
designed from the ground up for parallel test




Per Pin Instruments



Per Site Instruments



Programming per site



Asynchronous pattern control



Production interface designed for parallel test


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The Cost of Test
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Sept 2001

The Cost of Test

Semiconductor Test

Consumer Business Unit

SLIDE
15

Test Cost Reduction Measures from an ATE point
of view

No. 2:

Reduce cost of the test system
(Low capital cost tester)

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The Cost of Test
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Sept 2001

The Cost of Test

Semiconductor Test

Consumer Business Unit

SLIDE
16

No. 2: Reduce cost of the test system


Zero Footprint Design


Take advantage of leading
edge technology



High Reliability


Easy to use software


Low capital cost


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The Cost of Test
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Sept 2001

The Cost of Test

Semiconductor Test

Consumer Business Unit

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17

Test Cost Reduction Measures from an ATE point
of view

No. 3:

Reduce infrastructure costs

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The Cost of Test
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Sept 2001

The Cost of Test

Semiconductor Test

Consumer Business Unit

SLIDE
18

Floorspace usage of
typical Mainframe
Tester + Prober

4.57m

4.26m

Testhead

Handplug

Mainframe Tester

(3ft x 9ft)


CPU


Testhead

Probe

Manipulator

No. 3: Reduce infrastructure costs

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The Cost of Test
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Sept 2001

The Cost of Test

Semiconductor Test

Consumer Business Unit

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19

4.57m

4.26m

No. 3: Reduce infrastructure costs (cont.)


EG Prober

J750

Tester

CPU


EG Prober

J750

Tester

CPU


EG Prober

J750

Tester

CPU


EG Prober

J750

Tester

CPU

Reduce test costs
through optimized
floorspace usage

Zero Footprint
Tester + Prober

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The Cost of Test
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Sept 2001

The Cost of Test

Semiconductor Test

Consumer Business Unit

SLIDE
20

Conclusion


To continuously help semiconductor manufacturers to
reduce ‘The Cost of Test’ is ‘The’ challenge for the
ATE industry.


Several actions have been taken by the ATE industry
to reduce test costs.


Improve parallel test efficiency.


Provide low capital cost test equipment.


Reduce infrastructure requirements for ATE test
equipment (floorspace, cooling, power
consumption) through zero footprint designs.


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The Cost of Test
-

Sept 2001

The Cost of Test

Semiconductor Test

Consumer Business Unit

SLIDE
21

Thank You.